Electron microscopy
Electrons have wavelike properties. Due to their high energy, electrons have a very short wavelength. This translates into much higher resolutions than what would be possible with light microscopes.
Types of electron microscopes:
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Transmission Electron Microscopes (TEM) use a high voltage electron beam to produce an image, and the electrons that pass through the sample are detected.
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Scanning Electron Microscopes (SEM) produce an image by probing the surface of a specimen.
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Reflection electron microscopes (REM) use an electron beam that is pointed at a thin specimen to detect the scattered electrons that are reflected by the specimen.